SEU
SEU是Single event upset的缩写，中文译为单粒子翻转。是SEE的一种表现形式。
Single event upset (SEU) is defined by NASA as "radiation-inducederrors in microelectronic circuits caused when charged particles(usually from the radiation belts or from cosmic rays) lose energyby ionizing the medium through which they pass， leaving behind awake of electron-hole pairs。" [Ref: NASA Thesaurus] SEUs are transient soft errors， and are non-destructive。查看更多>>
