IGBT串联用的有源电压控制技术
5 结论
通过以上实验结果和分析,表明了有源电压控制技术是实现IGBT可靠串联的一种良好的方案。另一方面,在较高工作频率下,采用低耐压器件串联比采用单只高耐压器件具有多种好处,包括低损耗、低成本、高冗余度等。考虑到在目前的技术条件下,单个IGBT器件的耐压值再继续提高难度很大,所以能够实现IGBT器件可靠串联的有缘电压控制技术具有广泛的应用空间。
[附录]
Ps即Pswitching,是单个IGBT的开关损耗:Pswitching=( Eon+ Eoff)*f
Pc即Pconduction,是单个IGBT的导通损耗:
Pconduction=VCE,on*Ic*D
其中D为占空比,设定为50%,则平均的Pconduction应为:
Pconduction=VCE,on*Ic*0.5
Pts即Ptotal,single,是单个IGBT的总功率损耗:Ptotal=Pswitching+ Pconduction
Pt即Ptotal,是串、并联后每个方案中IGBT的
总功率损耗:
Ptotal=Ptotal,single*N
其中N是串、并联个数。
参考文献
1. Letor, R. Series connection of MOSFET, Bipolar and IGBT devices. SGS-Thomson Designers Guide to Power Products 1992.
2. K. Okamura, Y.W., K. Yokokura and I. Ohshima, High repetition rated semiconductor switch for excimer laser, in Proc. 19th IEEE Power Modulator Symp. . 1990: San Diego, CA. p. 407-410.
3. Beom-Seok, S., L. Toeck-Kie, and H. Dong-Seok. Synchronization on the points of turn-off time of series-connected power semiconductor devices using Miller effect. in Industrial Electronics, Control, Instrumentation, and Automation, 1992. Power Electronics and Motion Control., Proceedings of the 1992 International Conference on. 1992.
4. Gerster, C., P. Hofer, and N. Karrer. Gate-control strategies for snubberless operation of series connected IGBTs. in Power Electronics Specialists Conference, 1996. PESC '96 Record., 27th Annual IEEE. 1996.
5. Palmer, P.R. and A.N. Githiari, The series connection of IGBTs with active voltage sharing. Power Electronics, IEEE Transactions on, 1997. 12(4): p. 637-644.
6. Palmer, P.R., A.N. Githiari, and R.J. Leedham. Some scaling issues in the active voltage control of IGBT modules for high power applications. in Power Electronics Specialists Conference, 1997. PESC '97 Record., 28th Annual IEEE. 1997.
7. Githiari, A.N. and P.R. Palmer, Analysis of IGBT modules connected in series. Circuits, Devices and Systems, IEE Proceedings, 1998. 145(5): p. 354-360.
评论